Advanced multi-purpose scanning electron microscope for materials research

The proposal is to upgrade an existing scanning electron microscope at Electron Microscopy Centre (EMC) at Stockholm University, managed by Department of Materials and Environmental Chemistry. The Centre is also an open-access EM infrastructure for local, national and international users.

The upgrade will replace a 14-years old SEM, and will enhance advance EM infrastructure in the Centre as well as in Sweden.

Modern scanning electron microscopy is an indispensable characterization technique for physical and biological science research.

Its imaging, spectroscopy and their combination offer structure, microstructure and chemical analyses over eight orders of magnitude length scale continuously, from dm down to nm, that seamlessly bridge the gap between ultrahigh resolution and macroscopic techniques, e.g. transmission electron microscopy and synchrotron x-ray/neutron source techniques.

The proposed versatile microscope will offer high-throughput and multidimensional experiments for accelerating material development and will also provide new characterization possibilities for existing and new users from both academia and industry to investigate a variety of novel material systems and devices, which often contain multiple components, natural products, organic-inorganic hybrid materials and multiscale microstructures.

These materials are often used in many energy-, environment- and healthy-related applications, e.g. Li-ion battery, water purification and drug delivery systems. In addition, studying their native form by the proposed instrument will be more feasible. The enhanced infrastructure will provide internationally leading EM facilities and high-quality service.

A knowledge exchange hub for scientists and engineers in natural science, engineering and life science will be established.

EMC will contribute to Sweden’s leading position in terms of facilities and competences in structural, microstructural and chemical characterization at all length scales.