Traceable S-parameter measurements for next generation wireless systems

Purpose and goal: This project aims to develop metrological traceability and verification techniques for terahertz on-wafer Scattering parameter measurements to primary SI units. Expected results and effects: To facilitate the take-up of the technology and measurement infrastructure developed in the project by other NMIs with the view of forming a coordinated

network of NMIs that provide a comprehensive measurement capability as well as by the measurement supply chain (research institutes, calibration laboratories), standards developing organizations (e.g. IEEE P287 and IEEE P1785) and end users (i.e. electronic industries, manufacturers of calibration standards).

Approach and implementation: Discussion with external experts at NPL and other NMIs with ongoing

THz activities. Results will be used to evaluate the possibility of upgrading the measurement capabilities at RISE. Followed by design and fabrication of calibration standards and devices under test at NanoFab lab at Chalmers. Perform on-wafer S-parameter measurements from 300 GHz to 1.1 THz at the Kollberg Lab. Dissemination of results at international conferences (Presentations, workshops) and journal publications.